MEB-Iris System In-situ Correlative Microscopy

Partnership with O.N.E.R.A. (Denis BOIVIN, Yves RENOLLET- CHATILLON France)

MEB-Iris System In-situ Correlative Microscopy

Partnership with O.N.E.R.A. (Denis BOIVIN, Yves RENOLLET- CHATILLON France)

NewTec introduced a new concept of  correlative microscopy, by plaçing a macroscope inside a SEM chamber, the optical and electronic images are coaxial by construction.
The sample remains stationary, no need for re-alignment points or markers. Image repositioning is always smaller than the pixel size thanks to the mechanical design, switch from optical mode to electronic mode at will, optional motorized zoom & focus.

Optical image during a tensile test : Macroscopic view of the sample

SEM image pendant during a tensile test : Nanoscopic view at the center of the sample

IRIS System

Mirror motorization  on flange

Motorization on SEM stage

MEB IN – Optique Off

MEB Off – Optique IN

SEM Image

Optical Image