MEB-Iris System In-situ Correlative Microscopy
Partnership with O.N.E.R.A. (Denis BOIVIN, Yves RENOLLET- CHATILLON France)
MEB-Iris System In-situ Correlative Microscopy
Partnership with O.N.E.R.A. (Denis BOIVIN, Yves RENOLLET- CHATILLON France)
NewTec introduced a new concept of correlative microscopy, by plaçing a macroscope inside a SEM chamber, the optical and electronic images are coaxial by construction.
The sample remains stationary, no need for re-alignment points or markers. Image repositioning is always smaller than the pixel size thanks to the mechanical design, switch from optical mode to electronic mode at will, optional motorized zoom & focus.

Optical image during a tensile test : Macroscopic view of the sample



SEM image pendant during a tensile test : Nanoscopic view at the center of the sample



IRIS System

Mirror motorization on flange

Motorization on SEM stage

MEB IN – Optique Off

MEB Off – Optique IN

SEM Image

Optical Image