MEB-Iris System In-situ Correlative Microscopy
Partnership with O.N.E.R.A. (Denis BOIVIN, Yves RENOLLET- CHATILLON France)
MEB-Iris System In-situ Correlative Microscopy
Partnership with O.N.E.R.A. (Denis BOIVIN, Yves RENOLLET- CHATILLON France)
NewTec introduced a new concept of correlative microscopy, by plaçing a macroscope inside a SEM chamber, the optical and electronic images are coaxial by construction.
The sample remains stationary, no need for re-alignment points or markers. Image repositioning is always smaller than the pixel size thanks to the mechanical design, switch from optical mode to electronic mode at will, optional motorized zoom & focus.
Optical image during a tensile test : Macroscopic view of the sample
SEM image pendant during a tensile test : Nanoscopic view at the center of the sample
IRIS System
Mirror motorization on flange
Motorization on SEM stage
MEB IN – Optique Off
MEB Off – Optique IN
SEM Image
Optical Image